High resolution optical frequency domain reflectometry for characterization of components and assemblies
In this report we describe a method for polarization diverse OFDR that achieves, to the best of our knowledge, the highest reported combination of length and resolution.
We describe a technique for polarization sensitive optical frequency domain reflectometry (OFDR) that achieves 22 micrometer two-point spatial resolution over 35 meters of optical length with -97 dB sensitivity in a single measurement taking only seconds. We demonstrate OFDR’s versatility in both time- and frequency-domain metrology by analyzing a fiber Bragg grating (FBG) in both the spectral and impulse response domains. We also demonstrate how a polarization diversity receiver can be used in an OFDR system to track changes in the polarization state of light propagating through a birefringent component.
B. Soller, D. Gifford, M. Wolfe, and M. Froggatt, "High resolution optical frequency domain reflectometry for characterization of components and assemblies," Opt. Express 13, 666-674 (2005).